@techreport{1628b23476fe42f1809a43a8f04dd3a4,
title = "Cross-sectional AFM-imaging of thin film electroluminescent structures",
keywords = "atomic force microscopy, electroluminescence, thin film, atomic force microscopy, electroluminescence, thin film, atomic force microscopy, electroluminescence, thin film",
author = "Hanna Lattu and Erja Nyk{\"a}nen and Markku Leskel{\"a} and Lauri Niinist{\"o} and Roland Resch and Gernot Friedbacher",
year = "2000",
language = "English",
series = "Angewandte Oberfl{\"a}chenanalytic AOFA 11, Leipzig, September 24-28, 2000",
pages = "p.",
type = "WorkingPaper",
}