Controlling Penetration Depth in Projection Stereolithography by Adjusting the Operation Wavelength

P. Lehtinen, S. Laurila, M. Kaivola, Jouni Partanen

Tutkimustuotos: Lehtiartikkeli › Article › Scientific › vertaisarvioitu

1 Sitaatiot (Scopus)

Alkuperäiskieli	Englanti
Sivut	756-762
Sivumäärä	7
Julkaisu	Key Engineering Materials
Vuosikerta	611-612
DOI - pysyväislinkit	https://doi.org/10.4028/www.scientific.net/KEM.611-612.756
Tila	Julkaistu - 2014
OKM-julkaisutyyppi	A1 Julkaistu artikkeli, soviteltu

Siteeraa tätä

@article{4211057c824b4f61a3cdfe62f5fe74cb,

title = "Controlling Penetration Depth in Projection Stereolithography by Adjusting the Operation Wavelength",

keywords = "Stereolithography, Stereolithography, Stereolithography",

author = "P. Lehtinen and S. Laurila and M. Kaivola and Jouni Partanen",

year = "2014",

doi = "10.4028/www.scientific.net/KEM.611-612.756",

language = "English",

volume = "611-612",

pages = "756--762",

journal = "Key Engineering Materials",

issn = "1013-9826",

publisher = "TRANS TECH PUBLICATIONS",

}

TY - JOUR

T1 - Controlling Penetration Depth in Projection Stereolithography by Adjusting the Operation Wavelength

AU - Lehtinen, P.

AU - Laurila, S.

AU - Kaivola, M.

AU - Partanen, Jouni

PY - 2014

Y1 - 2014

KW - Stereolithography

UR - http://dx.doi.org/10.4028/www.scientific.net/KEM.611-612.756

U2 - 10.4028/www.scientific.net/KEM.611-612.756

DO - 10.4028/www.scientific.net/KEM.611-612.756

M3 - Article

VL - 611-612

SP - 756

EP - 762

JO - Key Engineering Materials

JF - Key Engineering Materials

SN - 1013-9826

ER -