@inproceedings{b4e959cec4a949ee90dbdfb336c0607b,
title = "Compound semiconductor detectors for X-ray astronomy: Spectroscopic measurements and material characteristics",
keywords = "semiconductor, spectroscopic measurements, X-ray astronomy, semiconductor, spectroscopic measurements, X-ray astronomy, semiconductor, spectroscopic measurements, X-ray astronomy",
author = "M. Bavdaz and S. Kraft and A. Peacock and F. Scholze and M. Wedowski and G. Ulm and S. Nenonen and M.-A. Gagliardi and T. Gagliardi and T. Tuomi and Hjelt, \{Kari T.\} and M. Juvonen",
year = "1997",
doi = "10.1557/PROC-487-565",
language = "English",
pages = "565--572",
booktitle = "Materials Research Society Fall Meeting, Boston, USA, December 1-5, 1997",
}