@inproceedings{0bbcb9e147ce4ce99a4dc017b541e07c,
title = "Characterization of chlorine doped SrS thin films by SIMS, RBS and XRF",
keywords = "chlorine, RBS, secondary ion mass spectroscopy (SIMS), thin films, XRF, chlorine, RBS, secondary ion mass spectroscopy (SIMS), thin films, XRF, chlorine, RBS, secondary ion mass spectroscopy (SIMS), thin films, XRF",
author = "S. Lehto and R. Lappalainen and J. Likonen and L. Niinist{\"o} and P. Soininen",
year = "1993",
language = "English",
pages = "LF5",
booktitle = "Euroanalysis VIII, Edinburgh, 5.-12.9.1993",
}