Abstrakti
The nature of intrinsic defects in ZnO films grown by metal organic vapor phase epitaxy was studied by positron annihilation and photoluminescence spectroscopy techniques. The supply of Zn and O during the film synthesis was varied by applying different growth temperatures (325–485 °C), affecting decomposition of the metal organic precursors. The microscopic identification of vacancy complexes was derived from a systematic variation in the defect balance in accordance with Zn/O supply trends.
Alkuperäiskieli | Englanti |
---|---|
Artikkeli | 046101 |
Sivut | 1-3 |
Sivumäärä | 3 |
Julkaisu | Journal of Applied Physics |
Vuosikerta | 108 |
Numero | 4 |
DOI - pysyväislinkit | |
Tila | Julkaistu - 2010 |
OKM-julkaisutyyppi | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä |
Tutkimusalat
- positron
- vacancy
- ZnO