Brittle Failure of Nanoscale Notched Silicon Cantilevers: A Finite Fracture Mechanics Approach

Pasquale Gallo, Alberto Sapora

Tutkimustuotos: LehtiartikkeliArticleScientificvertaisarvioitu

24 Lataukset (Pure)

Abstrakti

The present paper focuses on the Finite Fracture Mechanics (FFM) approach and verifies its applicability at the nanoscale. After the presentation of the analytical frame, the approach is verified against experimental data already published in the literature related to in situ fracture tests of blunt V-notched nano-cantilevers made of single crystal silicon, and loaded under mode I. The results show that the apparent generalized stress intensity factors at failure (i.e., the apparent generalized fracture toughness) predicted by the FFM are in good agreement with those obtained experimentally, with a discrepancy varying between 0 and 5%. All the crack advancements are larger than the fracture
process zone and therefore the breakdown of continuum-based linear elastic fracture mechanics is not yet reached. The method reveals to be an efficient and effective tool in assessing the brittle failure of notched components at the nanoscale.
AlkuperäiskieliEnglanti
Artikkeli1640
Sivumäärä13
JulkaisuAPPLIED SCIENCES
Vuosikerta10
Numero5
Varhainen verkossa julkaisun päivämäärä29 helmikuuta 2020
DOI - pysyväislinkit
TilaJulkaistu - 1 maaliskuuta 2020
OKM-julkaisutyyppiA1 Julkaistu artikkeli, soviteltu

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