Abstrakti
We perform fully bipolar Monte Carlo simulations of electrons and holes in III-Nitride multi-quantum well light-emitting diodes (LEDs) to investigate the effects of hot carriers. Our results show how accounting for hot carriers affects the current-voltage characteristics and device efficiency. We also discuss the effects of bandstructure details on the simulation results. Further simulations with versatile QW and EBL configurations are needed to confirm the relationship between hot carrier effects and current-voltage characteristics.
Alkuperäiskieli | Englanti |
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Otsikko | Proceedings of the International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD |
Kustantaja | IEEE |
Sivut | 11-12 |
Sivumäärä | 2 |
Vuosikerta | 2015-May |
ISBN (painettu) | 978-1-4799-8379-7 |
DOI - pysyväislinkit | |
Tila | Julkaistu - 10 toukok. 2015 |
OKM-julkaisutyyppi | A4 Artikkeli konferenssijulkaisussa |
Tapahtuma | International Conference on Numerical Simulation of Optoelectronic Devices - Taipei, Taiwan Kesto: 7 syysk. 2015 → 11 syysk. 2015 Konferenssinumero: 15 |
Conference
Conference | International Conference on Numerical Simulation of Optoelectronic Devices |
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Lyhennettä | NUSOD |
Maa/Alue | Taiwan |
Kaupunki | Taipei |
Ajanjakso | 07/09/2015 → 11/09/2015 |