@techreport{ace79c30c25648e9871cdf44270c9004,
title = "Back-reflection topographs of epitaxial laterally overgrown GaAs layers on Si substrate",
keywords = "gallium arsenide, silicon, synchrotron x-ray topography, gallium arsenide, silicon, synchrotron x-ray topography, gallium arsenide, silicon, synchrotron x-ray topography",
author = "R. Rantam{\"a}ki and T. Tuomi and Z.R. Zytkiewicz and P.J. McNally and A.N. Danilewsky",
year = "2000",
language = "English",
series = "HASYLAB-DESY Annual Report 1999",
pages = "885--886",
type = "WorkingPaper",
}