@article{2be0cb2e4a584532ae08583eaef1c6c3,
title = "An X-Ray topographic analysis of the crystal quality of globally available SiC wafers",
keywords = "SiC, synchrotron topography, SiC, synchrotron topography, SiC, synchrotron topography",
author = "Brazil, \{Ian C.\} and McNally, \{Patric J.\} and N. Ren and Lisa {"}O'Reilly{"} and Andreas Danilewsky and Tuomi, \{Turkka O.\} and Aapo Lankinen and Antti S{\"a}yn{\"a}tjoki and Rolf Simon and Stanislav Soloviev and Rowland, \{Larry B.\} and Sandvik, \{Peter M.\}",
year = "2007",
language = "English",
pages = "227--230",
journal = "Materials Science Forum",
issn = "1662-9760",
publisher = "Trans Tech Publications",
number = "556-557",
}