Accelerating synchrotron-based characterization of solar materials: Development of flyscan capability

Ashley E. Morishige; Hannu S. Laine; Mallory A. Jensen; Patricia X T Yen; Erin E. Looney; Stefan Vogt; Barry Lai; Hele Savin; Tonio Buonassisi

doi:10.1109/PVSC.2016.7749980

Accelerating synchrotron-based characterization of solar materials: Development of flyscan capability

Ashley E. Morishige, Hannu S. Laine, Mallory A. Jensen, Patricia X T Yen, Erin E. Looney, Stefan Vogt, Barry Lai, Hele Savin, Tonio Buonassisi

Electron Physics Group (EPG)

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Conference article in proceedings › Scientific › vertaisarvioitu

6 Sitaatiot (Scopus)

Abstrakti

Synchrotron-based μ-XRF is a powerful tool to measure elemental distributions non-destructively with high spatial resolution and excellent sensitivity. Recently, we implemented on-the-fly data collection (flyscan) at Beamline 2-ID-D at the Advanced Photon Source at Argonne National Laboratory, making data acquisition faster than 300 ms per pixel practical. We show that flyscan mode at Beamline 2-ID-D enables (a) traditional elemental maps to be completed twenty times more quickly while maintaining reasonably high sensitivity, and (b) practical studies of materials with an order of magnitude lower total impurity concentration and sparser spatial density of impurities. We highlight opportunities for flyscan to enable qualitatively new forms of microscopy, leveraging the accelerated data-acquisition rate for multi-dimensional mapping.

Alkuperäiskieli	Englanti
Otsikko	Proceedings of the43rd IEEE Photovoltaic Specialists Conference (PVSC)
Kustantaja	IEEE
Sivut	2006-2010
Sivumäärä	5
ISBN (elektroninen)	9781509027248
DOI - pysyväislinkit	https://doi.org/10.1109/PVSC.2016.7749980
Tila	Julkaistu - 18 marrask. 2016
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisussa
Tapahtuma	IEEE Photovoltaic Specialists Conference - Portland, Yhdysvallat Kesto: 5 kesäk. 2016 → 10 kesäk. 2016 Konferenssinumero: 43

Conference

Conference	IEEE Photovoltaic Specialists Conference
Lyhennettä	PVSC
Maa/Alue	Yhdysvallat
Kaupunki	Portland
Ajanjakso	05/06/2016 → 10/06/2016

Pääsy asiakirjaan

10.1109/PVSC.2016.7749980

Muut tiedostot ja linkit

Link to publication in Scopus

Siteeraa tätä

Morishige, A. E., Laine, H. S., Jensen, M. A., Yen, P. X. T., Looney, E. E., Vogt, S., Lai, B., Savin, H., & Buonassisi, T. (2016). Accelerating synchrotron-based characterization of solar materials: Development of flyscan capability. teoksessa Proceedings of the43rd IEEE Photovoltaic Specialists Conference (PVSC) (Sivut 2006-2010). Artikkeli 7749980 IEEE. https://doi.org/10.1109/PVSC.2016.7749980

@inproceedings{9820e3da467744e9a57f002ca79f81f2,

title = "Accelerating synchrotron-based characterization of solar materials: Development of flyscan capability",

abstract = "Synchrotron-based μ-XRF is a powerful tool to measure elemental distributions non-destructively with high spatial resolution and excellent sensitivity. Recently, we implemented on-the-fly data collection (flyscan) at Beamline 2-ID-D at the Advanced Photon Source at Argonne National Laboratory, making data acquisition faster than 300 ms per pixel practical. We show that flyscan mode at Beamline 2-ID-D enables (a) traditional elemental maps to be completed twenty times more quickly while maintaining reasonably high sensitivity, and (b) practical studies of materials with an order of magnitude lower total impurity concentration and sparser spatial density of impurities. We highlight opportunities for flyscan to enable qualitatively new forms of microscopy, leveraging the accelerated data-acquisition rate for multi-dimensional mapping.",

keywords = "correlative microscopy, detection limit, flyscan, silicon, synchrotron, X-ray fluorescence",

author = "Morishige, {Ashley E.} and Laine, {Hannu S.} and Jensen, {Mallory A.} and Yen, {Patricia X T} and Looney, {Erin E.} and Stefan Vogt and Barry Lai and Hele Savin and Tonio Buonassisi",

year = "2016",

month = nov,

day = "18",

doi = "10.1109/PVSC.2016.7749980",

language = "English",

pages = "2006--2010",

booktitle = "Proceedings of the43rd IEEE Photovoltaic Specialists Conference (PVSC)",

publisher = "IEEE",

address = "United States",

note = "IEEE Photovoltaic Specialists Conference, PVSC ; Conference date: 05-06-2016 Through 10-06-2016",

}

Morishige, AE, Laine, HS, Jensen, MA, Yen, PXT, Looney, EE, Vogt, S, Lai, B, Savin, H & Buonassisi, T 2016, Accelerating synchrotron-based characterization of solar materials: Development of flyscan capability. julkaisussa Proceedings of the43rd IEEE Photovoltaic Specialists Conference (PVSC)., 7749980, IEEE, Sivut 2006-2010, IEEE Photovoltaic Specialists Conference, Portland, Oregon, Yhdysvallat, 05/06/2016. https://doi.org/10.1109/PVSC.2016.7749980

Accelerating synchrotron-based characterization of solar materials: Development of flyscan capability. / Morishige, Ashley E.; Laine, Hannu S.; Jensen, Mallory A. et al.
Proceedings of the43rd IEEE Photovoltaic Specialists Conference (PVSC). IEEE, 2016. s. 2006-2010 7749980.

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Conference article in proceedings › Scientific › vertaisarvioitu

TY - GEN

T1 - Accelerating synchrotron-based characterization of solar materials

T2 - IEEE Photovoltaic Specialists Conference

AU - Morishige, Ashley E.

AU - Laine, Hannu S.

AU - Jensen, Mallory A.

AU - Yen, Patricia X T

AU - Looney, Erin E.

AU - Vogt, Stefan

AU - Lai, Barry

AU - Savin, Hele

AU - Buonassisi, Tonio

N1 - Conference code: 43

PY - 2016/11/18

Y1 - 2016/11/18

N2 - Synchrotron-based μ-XRF is a powerful tool to measure elemental distributions non-destructively with high spatial resolution and excellent sensitivity. Recently, we implemented on-the-fly data collection (flyscan) at Beamline 2-ID-D at the Advanced Photon Source at Argonne National Laboratory, making data acquisition faster than 300 ms per pixel practical. We show that flyscan mode at Beamline 2-ID-D enables (a) traditional elemental maps to be completed twenty times more quickly while maintaining reasonably high sensitivity, and (b) practical studies of materials with an order of magnitude lower total impurity concentration and sparser spatial density of impurities. We highlight opportunities for flyscan to enable qualitatively new forms of microscopy, leveraging the accelerated data-acquisition rate for multi-dimensional mapping.

AB - Synchrotron-based μ-XRF is a powerful tool to measure elemental distributions non-destructively with high spatial resolution and excellent sensitivity. Recently, we implemented on-the-fly data collection (flyscan) at Beamline 2-ID-D at the Advanced Photon Source at Argonne National Laboratory, making data acquisition faster than 300 ms per pixel practical. We show that flyscan mode at Beamline 2-ID-D enables (a) traditional elemental maps to be completed twenty times more quickly while maintaining reasonably high sensitivity, and (b) practical studies of materials with an order of magnitude lower total impurity concentration and sparser spatial density of impurities. We highlight opportunities for flyscan to enable qualitatively new forms of microscopy, leveraging the accelerated data-acquisition rate for multi-dimensional mapping.

KW - correlative microscopy

KW - detection limit

KW - flyscan

KW - silicon

KW - synchrotron

KW - X-ray fluorescence

UR - http://www.scopus.com/inward/record.url?scp=85003422077&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2016.7749980

DO - 10.1109/PVSC.2016.7749980

M3 - Conference article in proceedings

AN - SCOPUS:85003422077

SP - 2006

EP - 2010

BT - Proceedings of the43rd IEEE Photovoltaic Specialists Conference (PVSC)

PB - IEEE

Y2 - 5 June 2016 through 10 June 2016

ER -

Accelerating synchrotron-based characterization of solar materials: Development of flyscan capability

Abstrakti

Conference

Pääsy asiakirjaan

Muut tiedostot ja linkit

Sormenjälki

Siteeraa tätä