A calibration-free method to assess the quality of standards for THz on-wafer measurements

Maxim Masyukov; Irina Nefedova; Aleksi Tamminen; Kimmo Silvonen; Juan Cabello-Sanchez; Mikko Varonen; Mikko Kantanen; Helena Rodilla; Jan Stake; Zachary Taylor

doi:10.1109/IRMMW-THz50927.2022.9895704

A calibration-free method to assess the quality of standards for THz on-wafer measurements

Maxim Masyukov, Irina Nefedova, Aleksi Tamminen, Kimmo Silvonen, Juan Cabello-Sanchez, Mikko Varonen, Mikko Kantanen, Helena Rodilla, Jan Stake, Zachary Taylor

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Abstract › Scientific › vertaisarvioitu

Abstrakti

A method to assess the quality of the calibration standards has been developed and tested. The actual response of the tested transmission lines for LRRM-16 calibration approach has been simulated in HFSS environment, fabricated, and tested with on-wafer measurement setup. The method for quality assessment is based on the properties of similar matrices, that compares traces and determinants of the S-parameters products for fabricated and simulated structures.

Alkuperäiskieli	Englanti
Sivumäärä	2
DOI - pysyväislinkit	https://doi.org/10.1109/IRMMW-THz50927.2022.9895704
Tila	Julkaistu - 2022
OKM-julkaisutyyppi	Ei oikeutettu
Tapahtuma	International Conference on Infrared, Millimeter, and Terahertz Waves - Delft, Alankomaat Kesto: 28 elok. 2022 → 2 syysk. 2022 Konferenssinumero: 47

Conference

Conference	International Conference on Infrared, Millimeter, and Terahertz Waves
Lyhennettä	IRMMW-THz
Maa/Alue	Alankomaat
Kaupunki	Delft
Ajanjakso	28/08/2022 → 02/09/2022

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10.1109/IRMMW-THz50927.2022.9895704

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Masyukov, M., Nefedova, I., Tamminen, A., Silvonen, K., Cabello-Sanchez, J., Varonen, M., Kantanen, M., Rodilla, H., Stake, J., & Taylor, Z. (2022). A calibration-free method to assess the quality of standards for THz on-wafer measurements. Abstraktin lähde: International Conference on Infrared, Millimeter, and Terahertz Waves , Delft, Alankomaat. https://doi.org/10.1109/IRMMW-THz50927.2022.9895704

@conference{ce8ee1b9596d4920807e42d2c3ae7fde,

title = "A calibration-free method to assess the quality of standards for THz on-wafer measurements",

abstract = "A method to assess the quality of the calibration standards has been developed and tested. The actual response of the tested transmission lines for LRRM-16 calibration approach has been simulated in HFSS environment, fabricated, and tested with on-wafer measurement setup. The method for quality assessment is based on the properties of similar matrices, that compares traces and determinants of the S-parameters products for fabricated and simulated structures.",

author = "Maxim Masyukov and Irina Nefedova and Aleksi Tamminen and Kimmo Silvonen and Juan Cabello-Sanchez and Mikko Varonen and Mikko Kantanen and Helena Rodilla and Jan Stake and Zachary Taylor",

note = "Funding Information: M.M. acknowledges the IEEE MTT Society for the financial support of this study, as well as Ms. Divya Jayasankar and Mr. Yin Zeng for their help and stimulating discussions. Publisher Copyright: {\textcopyright} 2022 IEEE.; International Conference on Infrared, Millimeter, and Terahertz Waves , IRMMW-THz ; Conference date: 28-08-2022 Through 02-09-2022",

year = "2022",

doi = "10.1109/IRMMW-THz50927.2022.9895704",

language = "English",

}

Masyukov, M , Nefedova, I , Tamminen, A , Silvonen, K, Cabello-Sanchez, J, Varonen, M, Kantanen, M, Rodilla, H, Stake, J & Taylor, Z 2022, 'A calibration-free method to assess the quality of standards for THz on-wafer measurements', International Conference on Infrared, Millimeter, and Terahertz Waves , Delft, Alankomaat, 28/08/2022 - 02/09/2022. https://doi.org/10.1109/IRMMW-THz50927.2022.9895704

A calibration-free method to assess the quality of standards for THz on-wafer measurements. / Masyukov, Maxim ; Nefedova, Irina ; Tamminen, Aleksi et al.

2022. Abstraktin lähde: International Conference on Infrared, Millimeter, and Terahertz Waves , Delft, Alankomaat.

Tutkimustuotos: Artikkeli kirjassa/konferenssijulkaisussa › Abstract › Scientific › vertaisarvioitu

TY - CONF

T1 - A calibration-free method to assess the quality of standards for THz on-wafer measurements

AU - Masyukov, Maxim

AU - Nefedova, Irina

AU - Tamminen, Aleksi

AU - Silvonen, Kimmo

AU - Cabello-Sanchez, Juan

AU - Varonen, Mikko

AU - Kantanen, Mikko

AU - Rodilla, Helena

AU - Stake, Jan

AU - Taylor, Zachary

N1 - Conference code: 47

PY - 2022

Y1 - 2022

N2 - A method to assess the quality of the calibration standards has been developed and tested. The actual response of the tested transmission lines for LRRM-16 calibration approach has been simulated in HFSS environment, fabricated, and tested with on-wafer measurement setup. The method for quality assessment is based on the properties of similar matrices, that compares traces and determinants of the S-parameters products for fabricated and simulated structures.

AB - A method to assess the quality of the calibration standards has been developed and tested. The actual response of the tested transmission lines for LRRM-16 calibration approach has been simulated in HFSS environment, fabricated, and tested with on-wafer measurement setup. The method for quality assessment is based on the properties of similar matrices, that compares traces and determinants of the S-parameters products for fabricated and simulated structures.

UR - http://www.scopus.com/inward/record.url?scp=85139829537&partnerID=8YFLogxK

U2 - 10.1109/IRMMW-THz50927.2022.9895704

DO - 10.1109/IRMMW-THz50927.2022.9895704

M3 - Abstract

AN - SCOPUS:85139829537

T2 - International Conference on Infrared, Millimeter, and Terahertz Waves

Y2 - 28 August 2022 through 2 September 2022

ER -

A calibration-free method to assess the quality of standards for THz on-wafer measurements

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