TY - JOUR
T1 - A 350 mK, 9 T scanning tunneling microscope for the study of superconducting thin films on insulating substrates and single crystals
AU - Kamlapure, Anand
AU - Saraswat, Garima
AU - Ganguli, Somesh Chandra
AU - Bagwe, Vivas
AU - Raychaudhuri, Pratap
AU - Pai, Subash P.
PY - 2013/12/1
Y1 - 2013/12/1
N2 - We report the construction and performance of a low temperature, high field scanning tunneling microscope (STM) operating down to 350 mK and in magnetic fields up to 9 T, with thin film deposition and in situ single crystal cleaving capabilities. The main focus lies on the simple design of STM head and a sample holder design that allows us to get spectroscopic data on superconducting thin films grown in situ on insulating substrates. Other design details on sample transport, sample preparation chamber, and vibration isolation schemes are also described. We demonstrate the capability of our instrument through the atomic resolution imaging and spectroscopy on NbSe2 single crystal and spectroscopic maps obtained on homogeneously disordered NbN thin film.
AB - We report the construction and performance of a low temperature, high field scanning tunneling microscope (STM) operating down to 350 mK and in magnetic fields up to 9 T, with thin film deposition and in situ single crystal cleaving capabilities. The main focus lies on the simple design of STM head and a sample holder design that allows us to get spectroscopic data on superconducting thin films grown in situ on insulating substrates. Other design details on sample transport, sample preparation chamber, and vibration isolation schemes are also described. We demonstrate the capability of our instrument through the atomic resolution imaging and spectroscopy on NbSe2 single crystal and spectroscopic maps obtained on homogeneously disordered NbN thin film.
UR - http://www.scopus.com/inward/record.url?scp=84891722517&partnerID=8YFLogxK
U2 - 10.1063/1.4849616
DO - 10.1063/1.4849616
M3 - Article
AN - SCOPUS:84891722517
SN - 0034-6748
VL - 84
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
IS - 12
M1 - 123905
ER -