@article{674b2ef0efbf410d846b9fa47c4c2ff2,
title = "16-Term Error Model in Reciprocal Systems",
keywords = "16-term error model, calibration, network analyzer (NWA), on-wafer measurements, RF device modeling, scattering parameter measurement, 16-term error model, calibration, network analyzer (NWA), on-wafer measurements, RF device modeling, scattering parameter measurement, 16-term error model, calibration, network analyzer (NWA), on-wafer measurements, RF device modeling, scattering parameter measurement",
author = "Kimmo Silvonen and Krista Dahlberg and Tero Kiuru",
note = "VK: 4000103195",
year = "2012",
doi = "10.1109/TMTT.2012.2217150",
language = "English",
volume = "60",
pages = "3551--3558",
journal = "IEEE Transactions on Microwave Theory and Techniques",
issn = "0018-9480",
publisher = "IEEE",
number = "11",
}