Engineering & Materials Science
Silicon
100%
Passivation
71%
Aluminum oxide
60%
Germanium
56%
Photoluminescence
34%
Quantum efficiency
32%
Photodiodes
30%
Degradation
29%
Photodetectors
27%
Hydrogenation
26%
Crystalline materials
25%
Contamination
23%
Alumina
20%
Antireflection coatings
17%
Glass
16%
Carrier mobility
16%
Imaging techniques
16%
Defect density
15%
Optoelectronic devices
13%
Energy gap
12%
Copper
12%
Silicon nitride
12%
Defects
11%
Annealing
11%
Infrared radiation
10%
Charge density
9%
MOS devices
9%
Semiconductor devices
8%
Coatings
7%
Process monitoring
7%
Dangling bonds
7%
Lighting
7%
Boron
6%
Multi-junction solar cells
6%
Radiation detectors
6%
Hydrofluoric acid
6%
Chemical activation
6%
Dielectric films
6%
Impurities
5%
Hydrochloric acid
5%
Luminescence
5%
Chemical Compounds
Surface Recombination
97%
Chemical Passivation
50%
Velocity
35%
Surface
18%
Photoluminescence
16%
Field Effect
14%
Optoelectronics
12%
Illumination
11%
Annealing
11%
Nitride
10%
Compound Mobility
10%
Band Gap
10%
Dielectric Film
10%
Silicon Dioxide
8%
Semiconductor
8%
Charge Density
6%
Dielectric Material
6%
Solar Cell
6%
Physics & Astronomy
passivity
39%
silicon
34%
grasses
31%
harnesses
28%
aluminum oxides
24%
photodiodes
19%
germanium
18%
quantum efficiency
18%
incidence
17%
antireflection coatings
12%
glass
12%
defects
10%
semiconductor devices
8%
activation
8%
near infrared radiation
7%
coatings
7%
sensitivity
6%