Hakutulokset

• Studies from Aalto University in the Area of Technology Described (Impact of Inherent Design Limitations for Cu-sn Slid Microbumps On Its Electromigration Reliability for 3d Ics)

  Mervi Paulasto-Kröckel, Glenn Ross & Vesa Vuorinen

  20/01/2023

  1 kohde/ Medianäkyvyys

  Lehdistö/media: Esiintyminen mediassa