TY - JOUR
T1 - Zero Birefringence and Zero Birefringence Dispersion in 3 μm-thick Silicon-on-Insulator Waveguides
AU - Bryant, Katherine
AU - Hokkanen, Ari
AU - Shahwar, Dura
AU - Harjanne, Mikko
AU - Salmi, Antti
AU - Aalto, Timo
N1 - Publisher Copyright:
© 1983-2012 IEEE.
PY - 2024
Y1 - 2024
N2 - In this study, effective index birefringence and group index birefringence are investigated for 3 μm-thick silicon-on-insulator (SOI) strip waveguides, and experimental results are compared with simulations. We confirm zero group index birefringence at 1550 nm for a waveguide width of 2.6 μm; the absolute value of the same waveguide's group index birefringence is less than 2×10-4 over the measured 150 nm wavelength range. We further verify zero effective index birefringence at 1550 nm for a waveguide width of 3.2 μm, and the absolute value of its effective index birefringence is less than 6×10-5 over the same 150 nm wavelength range. Group and effective index birefringence dispersion are calculated based on the birefringence wavelength dependence, and the waveguide width needed to attain zero dispersion for either group or effective index birefringence is identified, at 3.1 μm and 2.7 μm, respectively. As a complement to our experimental findings, COMSOL simulations are conducted to analyze both the geometric-and stress-induced birefringence effects within the waveguides. The simulated birefringence values closely align with our experimental data, thereby validating the experimental results. We thus demonstrate the feasibility of achieving zero birefringence and zero birefringence dispersion through tuning the waveguide width in 3 μm SOI strip waveguides and validate these results via the agreement of a range of measurement methods and simulation.
AB - In this study, effective index birefringence and group index birefringence are investigated for 3 μm-thick silicon-on-insulator (SOI) strip waveguides, and experimental results are compared with simulations. We confirm zero group index birefringence at 1550 nm for a waveguide width of 2.6 μm; the absolute value of the same waveguide's group index birefringence is less than 2×10-4 over the measured 150 nm wavelength range. We further verify zero effective index birefringence at 1550 nm for a waveguide width of 3.2 μm, and the absolute value of its effective index birefringence is less than 6×10-5 over the same 150 nm wavelength range. Group and effective index birefringence dispersion are calculated based on the birefringence wavelength dependence, and the waveguide width needed to attain zero dispersion for either group or effective index birefringence is identified, at 3.1 μm and 2.7 μm, respectively. As a complement to our experimental findings, COMSOL simulations are conducted to analyze both the geometric-and stress-induced birefringence effects within the waveguides. The simulated birefringence values closely align with our experimental data, thereby validating the experimental results. We thus demonstrate the feasibility of achieving zero birefringence and zero birefringence dispersion through tuning the waveguide width in 3 μm SOI strip waveguides and validate these results via the agreement of a range of measurement methods and simulation.
KW - Birefringence
KW - effective index
KW - group index
KW - optical waveguides
KW - photonic integrated circuit
KW - polarization independence
KW - polarization mode dispersion
KW - refractive index
KW - silicon-on-insulator
KW - zero birefringence
UR - http://www.scopus.com/inward/record.url?scp=85205137410&partnerID=8YFLogxK
U2 - 10.1109/JLT.2024.3467707
DO - 10.1109/JLT.2024.3467707
M3 - Article
AN - SCOPUS:85205137410
SN - 0733-8724
JO - Journal of Lightwave Technology
JF - Journal of Lightwave Technology
ER -