X-ray diffraction study of GaN grown on patterned substrates

Research output: Contribution to journalArticleScientificpeer-review

Researchers

Research units

  • Optogan Oy
  • German Electron Synchrotron

Details

Original languageEnglish
Pages (from-to)1524-1527
Number of pages4
JournalPHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS
Volume8
Issue number5
Publication statusPublished - May 2011
MoE publication typeA1 Journal article-refereed

ID: 748275