XPS, XRF and AFM analysis of SrS:Ce thin films

H. Heikkinen, M. Peussa, H. Kotilainen, K. Kukli, E. Nykänen, L. Niinistö

    Research output: Working paperProfessional

    Original languageEnglish
    Pages25
    Publication statusPublished - 1997
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameFinnish Chemical Congress and Exhibition, Helsinki, Finland, 11.-13.11.1997
    PublisherThe Association of Finnish Chemical Societies

    Keywords

    • AFM
    • atomic layer epitaxy
    • strontium sulfide
    • thin film
    • XPS
    • XRF

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