XPS, XRF and AFM analysis of SrS:Ce thin films

H. Heikkinen, M. Peussa, H. Kotilainen, K. Kukli, E. Nykänen, L. Niinistö

    Research output: Working paperProfessional

    Original languageEnglish
    Pages25
    Publication statusPublished - 1997
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameFinnish Chemical Congress and Exhibition, Helsinki, Finland, 11.-13.11.1997
    PublisherThe Association of Finnish Chemical Societies

    Keywords

    • AFM
    • atomic layer epitaxy
    • strontium sulfide
    • thin film
    • XPS
    • XRF

    Cite this

    Heikkinen, H., Peussa, M., Kotilainen, H., Kukli, K., Nykänen, E., & Niinistö, L. (1997). XPS, XRF and AFM analysis of SrS:Ce thin films. (pp. 25). (Finnish Chemical Congress and Exhibition, Helsinki, Finland, 11.-13.11.1997).