xD-Reflect - Multidimensional Reflectometry for Industry a research project of the European Metrology Research Program (EMRP)

Andreas Höpe, Annette Koo, Carsten Forthmann, Francisco M. Verdú, Farshid Manoocheri, Frédéric B. Leloup, Gaël Obein, Gerd Wübbeler, Guillaume Ged, Joaquín Campos, Kai-Olaf Hauer, Li Yang, Marek Šmíd, Mikhail Langovoy, Paola Iacomussi, Priit Jaanson, Stefan Källberg

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationNewrad 2014, Espoo, Finland, June 24-27, 2014
Place of PublicationEspoo
Publication statusPublished - 2014
MoE publication typeA4 Article in a conference publication

Cite this

Höpe, A., Koo, A., Forthmann, C., Verdú, F. M., Manoocheri, F., Leloup, F. B., Obein, G., Wübbeler, G., Ged, G., Campos, J., Hauer, K-O., Yang, L., Šmíd, M., Langovoy, M., Iacomussi, P., Jaanson, P., & Källberg, S. (2014). xD-Reflect - Multidimensional Reflectometry for Industry a research project of the European Metrology Research Program (EMRP). In Newrad 2014, Espoo, Finland, June 24-27, 2014