X-ray Topography of Semiconductors Using Synchrotron Radiation

R. Rantamäki

    Research output: Book/ReportBookGeneral public

    Original languageEnglish
    Place of PublicationEspoo
    PublisherTeknillinen korkeakoulu
    Number of pages38
    Publication statusPublished - 1999
    MoE publication typeE2 Popularised monograph

    Keywords

    • contrast
    • gallium arsenide
    • overgrowth
    • silicon
    • synchrotron
    • x-ray topography

    Cite this