X-ray Topography of Semiconductors Using Synchrotron Radiation

R. Rantamäki

X-ray Topography of Semiconductors Using Synchrotron Radiation

R. Rantamäki

Research output: Book/Report › Book › General public

Original language	English
Place of Publication	Espoo
Publisher	Teknillinen korkeakoulu
Number of pages	38
Publication status	Published - 1999
MoE publication type	E2 Popularised monograph

Keywords

contrast
gallium arsenide
overgrowth
silicon
synchrotron
x-ray topography

Cite this

@book{30704da81eb24127833c3ea3f508e1ab,

title = "X-ray Topography of Semiconductors Using Synchrotron Radiation",

keywords = "contrast, gallium arsenide, overgrowth, silicon, synchrotron, x-ray topography, contrast, gallium arsenide, overgrowth, silicon, synchrotron, x-ray topography, contrast, gallium arsenide, overgrowth, silicon, synchrotron, x-ray topography",

author = "R. Rantam{\"a}ki",

year = "1999",

language = "English",

publisher = "Teknillinen korkeakoulu",

}

TY - BOOK

T1 - X-ray Topography of Semiconductors Using Synchrotron Radiation

AU - Rantamäki, R.

PY - 1999

Y1 - 1999

KW - contrast

KW - gallium arsenide

KW - overgrowth

KW - silicon

KW - synchrotron

KW - x-ray topography

KW - contrast

KW - gallium arsenide

KW - overgrowth

KW - silicon

KW - synchrotron

KW - x-ray topography

KW - contrast

KW - gallium arsenide

KW - overgrowth

KW - silicon

KW - synchrotron

KW - x-ray topography

M3 - Book

BT - X-ray Topography of Semiconductors Using Synchrotron Radiation

PB - Teknillinen korkeakoulu

CY - Espoo

ER -