X-ray photoelectron spectroscopy in the study of LaNiO3 thin films grown in an ALE reactor

L.-S. Johansson, M. Nieminen, L. Niinistö

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationHelsinki
    Pages17
    Publication statusPublished - 1996
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameThe 9th Symposium on Inorganic and Analytical Chemistry, Helsinki, 24.5.1996
    PublisherDepartment of Chemistry, University of Helsinki

    Keywords

    • ale
    • atomic layer epitaxy
    • esca
    • thin film
    • xps

    Cite this

    Johansson, L-S., Nieminen, M., & Niinistö, L. (1996). X-ray photoelectron spectroscopy in the study of LaNiO3 thin films grown in an ALE reactor. (pp. 17). (The 9th Symposium on Inorganic and Analytical Chemistry, Helsinki, 24.5.1996).