X-ray fluorescence analysis of SrS:Ce thin films

M. Peussa, E. Nykänen, K. Kukli, L. Niinistö

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationTartto
    Pages33
    Publication statusPublished - 1997
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameThe 4th Baltic Symposium on Atomic Layer Epitaxy, Tartu, Estonia, October 10-11, 1997

    Keywords

    • atomic layer epitaxy
    • cerium
    • strontium sulfide
    • thin film
    • XRF

    Cite this

    Peussa, M., Nykänen, E., Kukli, K., & Niinistö, L. (1997). X-ray fluorescence analysis of SrS:Ce thin films. (pp. 33). (The 4th Baltic Symposium on Atomic Layer Epitaxy, Tartu, Estonia, October 10-11, 1997).