X-Ray diffraction and Raman investigations of thickness dependent stress effects on Pb(Zrx Ti1-x)O3 thin films

Jyrki Lappalainen, V. Lantto, J. Frantti, J. Hiltunen

Research output: Contribution to journalArticleScientificpeer-review

11 Citations (Scopus)
Original languageEnglish
Pages (from-to)252901
JournalApplied Physics Letters
Issue number88
Publication statusPublished - 2006
MoE publication typeA1 Journal article-refereed

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