Wing tilt features in white beam synchrotron x-ray topographs of epitaxial lateral overgrown GaN

W.M. Chen, P.J. McNally, K. Jacobs, T. Tuomi, A.N. Danilewsky, D. Lowney, J. Kanatharana, L. Knuuttila, J. Riikonen

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationHampuri
    Pages865-866
    Publication statusPublished - 2002
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameHASYLAB-DESY Annual Report 2001, Part I

    Keywords

    • semiconductors
    • synchrotron x-ray topography

    Cite this

    Chen, W. M., McNally, P. J., Jacobs, K., Tuomi, T., Danilewsky, A. N., Lowney, D., Kanatharana, J., Knuuttila, L., & Riikonen, J. (2002). Wing tilt features in white beam synchrotron x-ray topographs of epitaxial lateral overgrown GaN. (pp. 865-866). (HASYLAB-DESY Annual Report 2001, Part I).