Why learning from failure isn’t easy (and what to do about it): Innovation trauma at Sun Microsystems

L. Välikangas, M. Hoegl, M. Gibbert

Research output: Contribution to journalArticleScientificpeer-review

34 Citations (Scopus)
Original languageEnglish
Pages (from-to)225-233
JournalEuropean Management Journal
Volume27
Publication statusPublished - 2009
MoE publication typeA1 Journal article-refereed

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