White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN

W.M. Chen, P.J. McNally, K. Jacobs, Turkka Tuomi, A.N. Danilewsky, D. Lowney, J. Kanatharana, L. Knuuttila, J. Riikonen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publication2001 MRS Materials Research Society Fall Meeting, Boston, Massachusetts USA, 26-30 November, 2001
    Publication statusPublished - 2002
    MoE publication typeA4 Article in a conference publication

    Keywords

    • semiconductors
    • synchrotron x-ray topography

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