@article{58b1194833f84bcda2653171258afbc1,
title = "White beam synchrotron x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN",
keywords = "semiconductors, synchrotron x-ray topography, semiconductors, synchrotron x-ray topography, semiconductors, synchrotron x-ray topography",
author = "W.M. Chen and P.J. McNally and K. Jacobs and T. Tuomi and A.N. Danilewsky and D. Lowney and J. Kanatharana and L. Knuuttila and J. Riikonen",
year = "2002",
language = "English",
pages = "pp. I3.27.1--I3.27.6",
journal = "Materials Research Society Symposia Proceedings",
issn = "1946-4274",
publisher = "Springer",
number = "693",
}