Wave optical simulation of the light trapping properties of black silicon surface textures

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Wave optical simulation of the light trapping properties of black silicon surface textures. / Bett, Alexander Jürgen; Eisenlohr, Johannes; Höhn, Oliver; Repo, Päivikki; Savin, Hele; Bläsi, Benedikt; Goldschmidt, Jan Christoph.

In: Optics Express, Vol. 24, No. 6, 21.03.2016, p. A434-A445.

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Bett, Alexander Jürgen ; Eisenlohr, Johannes ; Höhn, Oliver ; Repo, Päivikki ; Savin, Hele ; Bläsi, Benedikt ; Goldschmidt, Jan Christoph. / Wave optical simulation of the light trapping properties of black silicon surface textures. In: Optics Express. 2016 ; Vol. 24, No. 6. pp. A434-A445.

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@article{45ed407d47c14c678d8802d68fee2173,
title = "Wave optical simulation of the light trapping properties of black silicon surface textures",
abstract = "Due to their low reflectivity and effective light trapping properties black silicon nanostructured surfaces are promising front side structures for thin crystalline silicon solar cells. For further optimization of the light trapping effect, particularly in combination with rear side structures, it is necessary to simulate the optical properties of black silicon. Especially, the angular distribution of light in the silicon bulk after passage through the front side structure is relevant. In this paper, a rigorous coupled wave analysis of black silicon is presented, where the black silicon needle shaped structure is approximated by a randomized cone structure. The simulated absorptance agrees well with measurement data. Furthermore, the simulated angular light distribution within the silicon bulk shows that about 70{\%} of the light can be subjected to internal reflection, highlighting the good light trapping properties.",
author = "Bett, {Alexander J{\"u}rgen} and Johannes Eisenlohr and Oliver H{\"o}hn and P{\"a}ivikki Repo and Hele Savin and Benedikt Bl{\"a}si and Goldschmidt, {Jan Christoph}",
year = "2016",
month = "3",
day = "21",
doi = "10.1364/OE.24.00A434",
language = "English",
volume = "24",
pages = "A434--A445",
journal = "Optics Express",
issn = "1094-4087",
number = "6",

}

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TY - JOUR

T1 - Wave optical simulation of the light trapping properties of black silicon surface textures

AU - Bett, Alexander Jürgen

AU - Eisenlohr, Johannes

AU - Höhn, Oliver

AU - Repo, Päivikki

AU - Savin, Hele

AU - Bläsi, Benedikt

AU - Goldschmidt, Jan Christoph

PY - 2016/3/21

Y1 - 2016/3/21

N2 - Due to their low reflectivity and effective light trapping properties black silicon nanostructured surfaces are promising front side structures for thin crystalline silicon solar cells. For further optimization of the light trapping effect, particularly in combination with rear side structures, it is necessary to simulate the optical properties of black silicon. Especially, the angular distribution of light in the silicon bulk after passage through the front side structure is relevant. In this paper, a rigorous coupled wave analysis of black silicon is presented, where the black silicon needle shaped structure is approximated by a randomized cone structure. The simulated absorptance agrees well with measurement data. Furthermore, the simulated angular light distribution within the silicon bulk shows that about 70% of the light can be subjected to internal reflection, highlighting the good light trapping properties.

AB - Due to their low reflectivity and effective light trapping properties black silicon nanostructured surfaces are promising front side structures for thin crystalline silicon solar cells. For further optimization of the light trapping effect, particularly in combination with rear side structures, it is necessary to simulate the optical properties of black silicon. Especially, the angular distribution of light in the silicon bulk after passage through the front side structure is relevant. In this paper, a rigorous coupled wave analysis of black silicon is presented, where the black silicon needle shaped structure is approximated by a randomized cone structure. The simulated absorptance agrees well with measurement data. Furthermore, the simulated angular light distribution within the silicon bulk shows that about 70% of the light can be subjected to internal reflection, highlighting the good light trapping properties.

UR - http://www.scopus.com/inward/record.url?scp=84962724725&partnerID=8YFLogxK

U2 - 10.1364/OE.24.00A434

DO - 10.1364/OE.24.00A434

M3 - Article

VL - 24

SP - A434-A445

JO - Optics Express

JF - Optics Express

SN - 1094-4087

IS - 6

ER -

ID: 3056143