Wafer-scale graphene quality assessment using micro four-point probe mapping

David M.A. Mackenzie, Kristoffer G. Kalhauge, Patrick R. Whelan, Frederik W. Østergaard, Iwona Pasternak, Wlodek Strupinski, Peter Bøggild, Peter U. Jepsen, Dirch H. Petersen

Research output: Contribution to journalArticleScientificpeer-review

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