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Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact
Hannu S. Laine, Henri Vahlman, Antti Haarahiltunen, Mallory A. Jensen, Chiara Modanese, Matthias Wagner, Franziska Wolny, Tonio Buonassisi, Hele Savin*
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review
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