Projects per year
Abstract
As photovoltaic (PV) device architectures advance, they turn more sensitive to bulk minority charge carrier lifetime. The conflicting needs to develop ever advancing cell architectures on ever cheapening silicon substrates ensure that various impurity-related light-induced degradation (LID) mechanisms will remain an active research area in the silicon PV community. Here, we propose vertically integrated defect modeling as a framework to accelerate the identification and mitigation of different light induced defects. More specifically, we propose using modeled LID-kinetics to identify the dominant LID mechanism or mechanisms within complete PV devices. Coupling the LID-kinetics model into a process model allows development of process guidelines to mitigate the identified LID-mechanism within the same vertically integrated simulation tool. We use copper as an example of a well-characterized light-induced defect: we model the evolution of copper during solar cell processing and light soaking, and then map the deleterious lifetime effect of Cu-LID onto device performance. We validate our model using intentionally Cu-contaminated material processed on an industrial PERC-line and find that our model reproduces the LID-behavior of the manufactured solar cells. We further show via simulations that Cu-LID can be mitigated by reducing the contact co-firing peak temperature, or the cooling rate after the firing process.
Original language | English |
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Title of host publication | AIP Conference Proceedings |
Publisher | American Institute of Physics |
Volume | 1999 |
ISBN (Print) | 9780735417151 |
DOIs | |
Publication status | Published - 10 Aug 2018 |
MoE publication type | A4 Conference publication |
Event | International Conference on Crystalline Silicon Photovoltaics - Lausanne, Switzerland Duration: 18 Mar 2018 → 21 Mar 2018 Conference number: 8th |
Conference
Conference | International Conference on Crystalline Silicon Photovoltaics |
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Abbreviated title | SiliconPV |
Country/Territory | Switzerland |
City | Lausanne |
Period | 18/03/2018 → 21/03/2018 |
Fingerprint
Dive into the research topics of 'Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact'. Together they form a unique fingerprint.Projects
- 2 Finished
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Black silicon and defect engineering for highly efficient solar cells and modules, BLACK
Savin, H. (Principal investigator), Vähänissi, V. (Project Member), Pasanen, T. (Project Member), von Gastrow, G. (Project Member), Liu, Z. (Project Member), Haarahiltunen, A. (Project Member), Modanese, C. (Project Member), Yli-Koski, M. (Project Member), Rauha, I. (Project Member) & Laine, H. (Project Member)
01/03/2015 → 28/02/2018
Project: Business Finland: Other research funding
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Riddle of light induced degradation in silicon photovoltaics
Savin, H. (Principal investigator), Yli-Koski, M. (Project Member), Vahlman, H. (Project Member), Inglese, A. (Project Member), Modanese, C. (Project Member), Lindroos, J. (Project Member), Nampalli, N. (Project Member), Huang, H. (Project Member), von Gastrow, G. (Project Member), Vähänissi, V. (Project Member), Rauha, I. (Project Member) & Laine, H. (Project Member)
01/12/2012 → 31/12/2017
Project: EU: ERC grants