Validity of Measuring Metallic and Semiconducting Single-Walled Carbon Nanotube Fractions by Quantitative Raman Spectroscopy

Ying Tian*, Hua Jiang, Patrik Laiho, Esko I. Kauppinen

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

14 Citations (Scopus)


Carbon Nanotube Thin Film Transistors for Future Large Area Electronics

Kauppinen, E.


Project: Business Finland: Other research funding