Validity of Measuring Metallic and Semiconducting Single-Walled Carbon Nanotube Fractions by Quantitative Raman Spectroscopy

Ying Tian*, Hua Jiang, Patrik Laiho, Esko I. Kauppinen

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

14 Citations (Scopus)

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OtaNano

Anna Rissanen (Manager)

Aalto University

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