Vacancy defects in c-Si: electronic and ionic structures

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Scientific › peer-review

Original language	English
Title of host publication	Properties of Crystalline Silicon, EMIS Datareviews Series No. 20
Editors	R. Hull
Place of Publication	London, United Kingdom
Publisher	INSPEC, The Institution of Electrical Engineers
Pages	309
Publication status	Published - 1999
MoE publication type	A3 Part of a book or another research book

Cite this

@inbook{72434c18f231454689a6d4d0a9b90d0a,

title = "Vacancy defects in c-Si: electronic and ionic structures",

author = "R.M. Nieminen and M.J. Puska",

year = "1999",

language = "English",

pages = "309",

editor = "R. Hull",

booktitle = "Properties of Crystalline Silicon, EMIS Datareviews Series No. 20",

publisher = "INSPEC, The Institution of Electrical Engineers",

}