Vacancy defects in c-Si: electronic and ionic structures

R.M. Nieminen, M.J. Puska

Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

Original languageEnglish
Title of host publicationProperties of Crystalline Silicon, EMIS Datareviews Series No. 20
EditorsR. Hull
Place of PublicationLondon, United Kingdom
PublisherINSPEC, The Institution of Electrical Engineers
Publication statusPublished - 1999
MoE publication typeA3 Part of a book or another research book

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