Utilizing 3D height measurement in particle size analysis

J. Kaartinen, A. Tolonen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationThe 17th IFAC World Congress, Seoul, Korea, July 6-11, 2008
    EditorsMyung Jin Chung, Pradeep Misra, Hyungbo Shim
    Place of PublicationSeoul, Korea
    PublisherIFAC
    Pages6
    ISBN (Electronic)978-1-1234-7890-2
    Publication statusPublished - 2008
    MoE publication typeA4 Article in a conference publication

    Keywords

    • 3D measurements
    • image analysis
    • laser scanner
    • particle size
    • PLS
    • segmentation

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