@inproceedings{cf54a1c34da749c893c0a49793cb5316,
title = "Utilizing 3D height measurement in particle size analysis",
keywords = "3D measurements, image analysis, laser scanner, particle size, PLS, segmentation, 3D measurements, image analysis, laser scanner, particle size, PLS, segmentation, 3D measurements, image analysis, laser scanner, particle size, PLS, segmentation",
author = "J. Kaartinen and A. Tolonen",
year = "2008",
language = "English",
pages = "6",
editor = "Chung, {Myung Jin} and Pradeep Misra and Hyungbo Shim",
booktitle = "The 17th IFAC World Congress, Seoul, Korea, July 6-11, 2008",
publisher = "IFAC",
}