Using scalable computer vision to automate high-throughput semiconductor characterization

Alexander E. Siemenn^*, Eunice Aissi^*, Fang Sheng, Armi Tiihonen, Hamide Kavak, Basita Das, Tonio Buonassisi

^*Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

1 Citation (Scopus)

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Finished
-: Finnish Center for Artificial Intelligence
Kaski, S. (Principal investigator)
01/01/2019 → 31/12/2022
Project: Academy of Finland: Other research funding