Using scalable computer vision to automate high-throughput semiconductor characterization

Alexander E. Siemenn*, Eunice Aissi*, Fang Sheng, Armi Tiihonen, Hamide Kavak, Basita Das, Tonio Buonassisi

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

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Material Science

Computer Science