Using Multiple Re-Embeddings for Quantitative Steganalysis and Image Reliability Estimation

Yoan Miche, Patrick Bas, Amaury Lendasse

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationEspoo
    Pages19
    ISBN (Electronic)978-952-60-3250-4
    Publication statusPublished - 2010
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameTKK reports in information and computer science
    PublisherAalto-yliopiston teknillinen korkeakoulu
    No.34; TKK-ICS-R34
    ISSN (Print)1797-5034
    ISSN (Electronic)1797-5042

    Keywords

    • inner image difficulty
    • OP-ELM
    • quantitative steganalysis
    • re-embedding
    • steganalysis
    • steganography

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