Use of Total Internal Reflection Raman (TIR) and Attenuated Total Reflection Infrared (ATR-IR) Spectroscopy to Analyze Component Separation in Thin Offset Ink Films After Setting on Coated Paper Surfa

Antti Kivioja; Timo Hartus; Tapani Vuorinen; Patrick Gane; Anna-Stiina Jaaskelainen

Use of Total Internal Reflection Raman (TIR) and Attenuated Total Reflection Infrared (ATR-IR) Spectroscopy to Analyze Component Separation in Thin Offset Ink Films After Setting on Coated Paper Surfa

Antti Kivioja, Timo Hartus, Tapani Vuorinen, Patrick Gane, Anna-Stiina Jaaskelainen

Research output: Contribution to journal › Article › Scientific › peer-review

4 Citations (Scopus)

Original language	English
Pages (from-to)	661-671
Journal	Applied Spectroscopy
Volume	67
Issue number	6
Publication status	Published - 2013
MoE publication type	A1 Journal article-refereed

Cite this

Kivioja, A., Hartus, T., Vuorinen, T., Gane, P., & Jaaskelainen, A-S. (2013). Use of Total Internal Reflection Raman (TIR) and Attenuated Total Reflection Infrared (ATR-IR) Spectroscopy to Analyze Component Separation in Thin Offset Ink Films After Setting on Coated Paper Surfa. Applied Spectroscopy, 67(6), 661-671.

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title = "Use of Total Internal Reflection Raman (TIR) and Attenuated Total Reflection Infrared (ATR-IR) Spectroscopy to Analyze Component Separation in Thin Offset Ink Films After Setting on Coated Paper Surfa",

author = "Antti Kivioja and Timo Hartus and Tapani Vuorinen and Patrick Gane and Anna-Stiina Jaaskelainen",

note = "VK: T10401",

year = "2013",

language = "English",

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pages = "661--671",

journal = "Applied Spectroscopy",

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Use of Total Internal Reflection Raman (TIR) and Attenuated Total Reflection Infrared (ATR-IR) Spectroscopy to Analyze Component Separation in Thin Offset Ink Films After Setting on Coated Paper Surfa. / Kivioja, Antti; Hartus, Timo ; Vuorinen, Tapani ; Gane, Patrick; Jaaskelainen, Anna-Stiina.

In: Applied Spectroscopy, Vol. 67, No. 6, 2013, p. 661-671.

Research output: Contribution to journal › Article › Scientific › peer-review

TY - JOUR

T1 - Use of Total Internal Reflection Raman (TIR) and Attenuated Total Reflection Infrared (ATR-IR) Spectroscopy to Analyze Component Separation in Thin Offset Ink Films After Setting on Coated Paper Surfa

AU - Kivioja, Antti

AU - Hartus, Timo

AU - Vuorinen, Tapani

AU - Gane, Patrick

AU - Jaaskelainen, Anna-Stiina

N1 - VK: T10401

PY - 2013

Y1 - 2013

M3 - Article

VL - 67

SP - 661

EP - 671

JO - Applied Spectroscopy

JF - Applied Spectroscopy

SN - 0003-7028

IS - 6

ER -