Unsupervised Segmentation of Surface Defects with Simple Texture Measures

Jukka Iivarinen

    Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

    Original languageEnglish
    Title of host publicationTexture Analysis in Machine Vision, Series in Machine Perception and Artificial Intelligence - Vol. 40
    EditorsM. Pietikäinen
    PublisherWORLD SCIENTIFIC
    Pages231-238
    Publication statusPublished - 2000
    MoE publication typeA3 Part of a book or another research book

    Keywords

    • defect detection
    • local binary pattern
    • self-organizing map
    • texture segmentation
    • unsupervised segmentation

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