Unsupervised Segmentation of Surface Defects with Simple Texture Measures

J. Iivarinen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationWorkshop of Texture Analysis in Machine Vision, Oulu, Finland, June 14-15, 1999
    Pages53-58
    Publication statusPublished - 1999
    MoE publication typeA4 Article in a conference publication

    Keywords

    • local binary pattern
    • self-organizing map
    • texture analysis
    • unsupervised learning

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