@techreport{65dd9a0013b8495fb5be16c62d1c2896,
title = "Unsupervised Segmentation of Surface Defects",
keywords = "segmentation, self-organizing map, surface inspection, segmentation, self-organizing map, surface inspection, segmentation, self-organizing map, surface inspection",
author = "J. Iivarinen and J. Rauhamaa and A. Visa",
year = "1996",
language = "English",
series = "13th International Conference on Pattern Recognition, Wien, Austria, August 25-30, 1996",
pages = "Vol. IV, 356--360",
type = "WorkingPaper",
}