Unsupervised Segmentation of Surface Defects

J. Iivarinen, J. Rauhamaa, A. Visa

    Research output: Working paperProfessional

    25 Citations (Scopus)
    Original languageEnglish
    PagesVol. IV, 356-360
    Publication statusPublished - 1996
    MoE publication typeD4 Published development or research report or study

    Publication series

    Name13th International Conference on Pattern Recognition, Wien, Austria, August 25-30, 1996

    Keywords

    • segmentation
    • self-organizing map
    • surface inspection

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