Unambiguous interpretation of atomically resolved force microscopy images of an insulator

A. S. Foster, C. Barth, A. L. Shluger, M. Reichling

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
Pages (from-to)2373-2376
Number of pages4
JournalPhysical Review Letters
Volume86
Issue number11
DOIs
Publication statusPublished - 2001
MoE publication typeA1 Journal article-refereed

Keywords

  • AFM
  • Insulators
  • Simulation

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