Ultra-Thin Silicon Nitride X-Ray Windows

Pekka Tuomas Törmä, Heikki Johannes Sipilä, Marco Mattila, Pasi Kostamo, Jari Kostamo, Esa Kostamo, Harri Lipsanen, Nick Nelms, Brian Shortt, Marcos Bavdaz, Christian Laubis

Research output: Contribution to journalArticleScientificpeer-review

11 Citations (Scopus)
Original languageEnglish
Pages (from-to)1311-1314
Number of pages4
JournalIEEE Transactions on Nuclear Science
Volume60
Issue number2
DOIs
Publication statusPublished - 19 Mar 2013
MoE publication typeA1 Journal article-refereed

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