Two-level blackout probabilistic risk analysis: Application to a test system

P. Henneaux, F. Faghihi, P.E. Labeau, J.C. Maun, L Haarla

    Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

    4 Citations (Scopus)
    Original languageEnglish
    Title of host publicationSafety, Reliability and Risk Analysis: Beyond the Horizon
    EditorsR.D.J.M. Steenbergen, P.H.A.J.M van Gelder, S Miraglia, A.C.W.M. Vrouwenvelder
    Place of PublicationAmsterdam
    Pages2855-2863
    Publication statusPublished - 2013
    MoE publication typeA3 Part of a book or another research book

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