Trends in the valence band electronic structures of mixed uranium oxides

Research output: Contribution to journalArticleScientificpeer-review

Researchers

  • Kristina O. Kvashnina
  • Piotr M. Kowalski
  • Sergei M. Butorin
  • Gregory Leinders
  • Janne Pakarinen
  • Ph.D. Rene Bes

  • Haijian Li
  • Marc Verwerft

Research units

  • Forschungszentrum Jülich
  • Uppsala University
  • Belgian Nuclear Research Center
  • Helmholtz-Zentrum Dresden Rossendorf
  • European Synchrotron Radiation Facility
  • Jülich Aachen Research Alliance

Abstract

The valence band electronic structures of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, and β-UO3) have been studied using the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and computational methods. We show here that the RIXS technique and recorded U 5f-O 2p charge transfer excitations can be used to test the validity of theoretical approximations.

Details

Original languageEnglish
Pages (from-to)9757-9760
Number of pages4
JournalChemical Communications
Volume54
Issue number70
Publication statusPublished - 1 Jan 2018
MoE publication typeA1 Journal article-refereed

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