Trends in the valence band electronic structures of mixed uranium oxides

Kristina O. Kvashnina*, Piotr M. Kowalski, Sergei M. Butorin, Gregory Leinders, Janne Pakarinen, René Bès, Haijian Li, Marc Verwerft

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

11 Citations (Scopus)
83 Downloads (Pure)

Abstract

The valence band electronic structures of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, and β-UO3) have been studied using the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and computational methods. We show here that the RIXS technique and recorded U 5f-O 2p charge transfer excitations can be used to test the validity of theoretical approximations.

Original languageEnglish
Pages (from-to)9757-9760
Number of pages4
JournalChemical Communications
Volume54
Issue number70
DOIs
Publication statusPublished - 1 Jan 2018
MoE publication typeA1 Journal article-refereed

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