Trends in the valence band electronic structures of mixed uranium oxides

Kristina O. Kvashnina*, Piotr M. Kowalski, Sergei M. Butorin, Gregory Leinders, Janne Pakarinen, René Bès, Haijian Li, Marc Verwerft

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)
54 Downloads (Pure)

Abstract

The valence band electronic structures of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, and β-UO3) have been studied using the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and computational methods. We show here that the RIXS technique and recorded U 5f-O 2p charge transfer excitations can be used to test the validity of theoretical approximations.

Original languageEnglish
Pages (from-to)9757-9760
Number of pages4
JournalChemical Communications
Volume54
Issue number70
DOIs
Publication statusPublished - 1 Jan 2018
MoE publication typeA1 Journal article-refereed

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  • Cite this

    Kvashnina, K. O., Kowalski, P. M., Butorin, S. M., Leinders, G., Pakarinen, J., Bès, R., ... Verwerft, M. (2018). Trends in the valence band electronic structures of mixed uranium oxides. Chemical Communications, 54(70), 9757-9760. https://doi.org/10.1039/c8cc05464a