Transport measurements in SISNSIS single-electron transistors

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Original languageEnglish
Pages (from-to)1826-1827
Number of pages2
JournalPhysica B
Volume284-288
Issue numberPart 2
Publication statusPublished - 2000
MoE publication typeA1 Journal article-refereed

    Research areas

  • Johnson noise, JQP cycle, proximity effect, single electron transistor

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