Traceability of laser frequency calibrations at MIKES

Mikko Merimaa, Kaj Nyholm, Markku Vainio, Antti Lassila

    Research output: Contribution to journalArticleScientificpeer-review

    15 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)500-504
    JournalIEEE Transactions on Instrumentation and Measurement
    Volume56
    Issue number2
    Publication statusPublished - 2007
    MoE publication typeA1 Journal article-refereed

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