Traceability of laser frequency calibrations at MIKES

Mikko Merimaa, Kaj Nyholm, Markku Vainio, Antti Lassila

Research output: Contribution to journalArticleScientificpeer-review

15 Citations (Scopus)
Original languageEnglish
Pages (from-to)500-504
JournalIEEE Transactions on Instrumentation and Measurement
Volume56
Issue number2
Publication statusPublished - 2007
MoE publication typeA1 Journal article-refereed

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