Original language | English |
---|---|
Title of host publication | IEC TC 42, Kioto, 18.-20.10.1999 |
Pages | 3 |
Publication status | Published - 1999 |
MoE publication type | A4 Conference publication |
Keywords
- high voltage
- traceability
M. Aro, J. Hällström
Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review
Original language | English |
---|---|
Title of host publication | IEC TC 42, Kioto, 18.-20.10.1999 |
Pages | 3 |
Publication status | Published - 1999 |
MoE publication type | A4 Conference publication |