Traceability and mutual Recognition of Impulse Voltage Measurements.

M. Aro, J. Hällström

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationIEC TC 42, Kioto, 18.-20.10.1999
Pages3
Publication statusPublished - 1999
MoE publication typeA4 Article in a conference publication

Keywords

  • high voltage
  • traceability

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